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PhotriX Wavelength |
The PhotriXTM system from Luxtron uses detectors that offer numerous advantages including: - Greater sensitivity enabling higher resolution and accuracy
- Detecting semiconductor materials like Silicon that are transparent above 1µm
- Minimizing the effect of emissivity errors
The PhotriXTM is offered in 3 detector types with varying wavelength sensitivity tailored for specific applications. See table below for more detail. |  | |
Detector Type | Spectral
Response | Temperature Range
Min Max | Intended Purpose | | XE | 880 nm | 195 °C | 3000 °C | Compound Semiconductor
(GaAs, InP, Single Crystal SiC) | | XN | 900 nm | 190 °C | 3000 °C | Semiconductor, Silicon Wafer Measurements | | WX | 700 - 1650 nm * | 190 °C | 630 °C | Low Temperature Process
Measurements of Metals,
Ceramics and Metal Oxides | * depends on configuration of optics. A single system may not cover entire range |
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